InsightX Agent: An LMM-Based Agentic Framework With Integrated Tools for Reliable X-Ray NDT Analysis
Abstract
Non-destructive testing (NDT), particularly X-ray inspection, is vital for industrial quality assurance, yet existing deep-learning-based approaches often lack interactivity, interpretability, and the capacity for critical self-assessment, limiting their reliability and operator trust. To address these shortcomings, this paper proposesInsightX Agent, a novel LMM-based agentic framework designed to deliver reliable, interpretable, and interactive X-ray NDT analysis. Unlike typical sequential pipelines,InsightX Agentpositions a Large Multimodal Model (LMM) as a central orchestrator, coordinating between the Sparse Deformable Multi-Scale Detector (SDMSD) and the Evidence-Grounded Reflection (EGR) tool. The SDMSD generates dense defect region proposals from multi-scale feature maps and sparsifies them through Non-Maximum Suppression (NMS), optimizing detection of small, dense targets in X-ray images while maintaining computational efficiency. The EGR tool guides the LMM agent through a chain-of-thought-inspired review process, incorporating context assessment, individual defect analysis, false positive elimination, confidence recalibration and quality assurance to validate and refine the SDMSD's initial proposals. By strategically employing and intelligently using tools,InsightX Agentmoves beyond passive data processing to active reasoning, enhancing diagnostic reliability and providing interpretations that integrate diverse information sources. Experimental evaluations on the GDXray+ dataset demonstrate thatInsightX Agentnot only achieves a high object detection F1-score of 96.54% but also offers significantly improved interpretability and trustworthiness in its analyses, highlighting the transformative potential of LMM-based agentic frameworks for industrial inspection tasks.
Fields of Study & Subjects
Advanced Neural Network Applications
Advanced X-ray and CT Imaging
Machine Learning in Materials Science
Publication details
- Journal / source
- IEEE Transactions on Reliability
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Volume
- 75
- Pages
- 1455–1468
- Publication date
- 1 January 2026
- Language
- EN