Modeling and Estimation for Degradation Data With Initiation-Growth Correlations

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Authors: Wenhui Wu, Bing Xing Wang, Piao Chen
Cited by: 4
References: 35

Abstract

Influenced by dynamic environmental factors, the degradation rates of products often vary with initial levels. However, most existing degradation models assume a fixed or zero starting point and treat it as independent of subsequent process, leading to biased failure-time predictions, poorly timed maintenance, and elevated costs or risks. To fill this gap, we propose a Wiener-process degradation model that explicitly links the random initial phase to its ongoing deterioration, allowing both the degradation rate and the failure threshold to adapt to the initial state. We derive explicit expressions for the lifetime and remaining useful life (RUL) distributions, along with confidence intervals for model parameters. To construct confidence intervals for reliability metrics and prediction intervals for RUL, we propose tailored generalized inference and objective Bayesian inference, which ensure accurate coverage even in small samples. Through simulations and a real-world case study, we demonstrate that our approach more accurately captures individual variability and delivers tighter, more reliable life-time forecasts than traditional models.

Fields of Study & Subjects

Reliability and Maintenance Optimization Statistical Distribution Estimation and Applications Advanced Statistical Process Monitoring

Publication details

Journal / source
IEEE Transactions on Reliability
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
75
Pages
1377–1391
Publication date
1 January 2026