Small Sample Fault Diagnosis Using Gap-Regularized Loss and Multiscale Attention CNN

IEEE Transactions on Reliability 2026

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Authors: Lihao Ye, Ke Zhang, Bin Jiang, S. Simani, Xue Li

DOI: 10.1109/tr.2026.3682327

Cited by: 1

References: 31

Fields of Study & Subjects

Machine Fault Diagnosis Techniques Fault Detection and Control Systems VLSI and Analog Circuit Testing

References 31