RC-RAG: A Reliability-Centered Retrieval-Augmented LLM Framework for PHM Question Answering

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Authors: Hanqi Su, Ruoxin Wang, Dai-Yan Ji, Jay Lee
Cited by: 1
References: 36

Abstract

Large language model (LLM)-based question answering has the potential to improve access to technical knowledge, but hallucinated responses remain a severe reliability risk when answers are generated without sufficient evidential support. In reliability-critical domains such as prognostics and health management (PHM), this risk is particularly concerning, as unsupported information can lead to incorrect maintenance decisions or unsafe actions. However, existing retrieval-augmented generation pipelines often lack explicit control over evidence sufficiency and could produce wrong answers, thereby raising concerns about artificial intelligence (AI) reliability issues. In this article, we propose RC-RAG, a reliability-centered retrieval-augmented generation (RAG) framework for PHM question answering that explicitly incorporates evidence evaluation and verification into the retrieval and generation pipeline. RC-RAG augments PHM literature with document-level meta-knowledge, performs hierarchical document–content retrieval, and applies relevance and evidence assessment with verification-aware answer generation to ensure that answers are produced only when sufficient and consistent evidence is available. To evaluate the framework, we construct a curated PHM data challenge question-answering benchmark (PHMQA) derived from a series of PHM conferences and data challenge competitions, including those organized by the IEEE Reliability Society and the PHM research community. Experimental results show that RC-RAG achieves significantly higher accuracy and precision compared to other state-of-the-art methods.

Fields of Study & Subjects

Topic Modeling Advanced Graph Neural Networks Intelligent Tutoring Systems and Adaptive Learning

Publication details

Journal / source
IEEE Transactions on Reliability
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
75
Pages
2159–2173
Publication date
1 January 2026