TraceHG: An Unsupervised Dual-View Framework for Microservice Anomaly Detection

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Authors: Ningning Han, Siyang Lu, Zaichao Lin, Boyang Li, Nan Wang, Xin Luo
Cited by: 1
References: 48

Abstract

Traces and logs record the behaviors and interactions between microservices, making them indispensable for diagnosing system anomalies. However, the intricate and flexible architecture of microservices presents significant challenges for automated anomaly detection. Existing approaches often struggle to capture the internal dynamics and correlations among microservices, which limits their ability to comprehensively detect anomalies arising from synchronous or asynchronous calls. Therefore, we categorize three prevalent anomaly paradigms in microservice systems: intra-service, inter-service, and joint anomalies. To address these challenges, we propose a novel unsupervised learning framework for dual-view anomaly detection, named TraceHG. Specifically, it constructs the trace graph composed of logs, response times, and traces. Besides, TraceHG utilizes hypergraph transformation to establish two views, providing comprehensive information in microservices. Furthermore, we introduce a dual-view framework that leverages both a hypergraph-view and a graph-view encoders to explicitly learn associations among microservices. These two views, employing graph and HGNNs, capture representations of internal dynamics, invocations, and their associated contexts in microservices. By constructing two minimized hyperspheres and measuring the distances from their centers in the latent space, we identify anomalies based on the anomaly scores. Extensive experiments on public benchmark datasets demonstrate that the proposed framework outperforms several state-of-the-art baselines in microservice anomaly detection.

Fields of Study & Subjects

Software System Performance and Reliability Network Security and Intrusion Detection Software Testing and Debugging Techniques

Publication details

Journal / source
IEEE Transactions on Services Computing
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
19
Issue
2
Pages
1633–1646
Publication date
24 February 2026