Multiscale Convolutional Neural Network With Self-Attention Mechanism and Soft Thresholding for Industrial Process Fault Diagnosis
Fields of Study & Subjects
Fault Detection and Control Systems
Machine Fault Diagnosis Techniques
Machine Learning and ELM
Publication details
- Journal / source
- IEEE Transactions on Systems Man and Cybernetics Systems
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Volume
- 56
- Issue
- 4
- Pages
- 2647–2659
- Publication date
- 22 January 2026