Multiscale Convolutional Neural Network With Self-Attention Mechanism and Soft Thresholding for Industrial Process Fault Diagnosis

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Authors: Youqiang Chen, Ridong Zhang
Cited by: 7
References: 35

Fields of Study & Subjects

Fault Detection and Control Systems Machine Fault Diagnosis Techniques Machine Learning and ELM

Publication details

Journal / source
IEEE Transactions on Systems Man and Cybernetics Systems
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
56
Issue
4
Pages
2647–2659
Publication date
22 January 2026