VaN3Twin: The Multi-Technology V2X Digital Twin With Ray Tracing in the Loop

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Authors: Roberto Pegurri, Diego Gasco, Francesco Linsalata, Marco Rapelli, Eugenio Moro, Francesco Raviglione, Claudio Casetti
Cited by: 3
References: 68

Abstract

This paper presents VaN3Twin—the first open source, full-stack Network Digital Twin (NDT) framework for simulating the coexistence of multiple Vehicle-to-Everything (V2X) communication technologies with accurate physical-layer modeling via ray tracing. VaN3Twin extends the ms-van3t simulator by integrating Sionna Ray Tracer (RT) in the loop, enabling high-fidelity representation of wireless propagation, including diverse Line of Sight (LoS) conditions with a focus on LoS blockage due to other vehicles’ meshes, Doppler effect, and site-dependent effects—e.g., scattering and diffraction. Unlike conventional simulation tools, the proposed framework supports realistic coexistence analysis across Dedicated Short Range Communication (DSRC) and Cellular-V2X (C-V2X) technologies operating over a shared spectrum. A dedicated interference tracking module captures cross-technology interference at the time-frequency resource block level and enhances Signal to Interference plus Noise Ratio (SINR) estimation by eliminating artifacts such as the bimodal behavior induced by separate LoS/NLoS propagation models. Compared to field measurements, VaN3Twin reduces application-layer disagreement by 50% in rural and over 70% in urban environments with respect to current state of the art simulation tools, demonstrating its value for scalable and accurate digital twin–based V2X coexistence simulation.

Fields of Study & Subjects

Digital Transformation in Industry Advanced X-ray and CT Imaging Technology Assessment and Management

Publication details

Journal / source
IEEE Transactions on Wireless Communications
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
25
Pages
16812–16827
Publication date
1 January 2026
Language
EN