WARP-TPG: Warpage-Aware Test Pattern Generation for Small-Delay Defects*
Fields of Study & Subjects
VLSI and Analog Circuit Testing
Software Testing and Debugging Techniques
Engineering and Test Systems
Publication details
- Journal / source
- 2026 IEEE 44th VLSI Test Symposium (VTS)
- Publisher
- IEEE
- Pages
- 1–7
- Publication date
- 27 April 2026