New horizons in QPI through physics-informed aberration correction learning
Abstract
This commentary highlights a significant advancement in the field of quantitative phase imaging by developing a physics-informed cycle-consistent network (PICNet) designed for real-time adaptive aberration correction. The proposed framework opens a new way for self-calibrating phase imaging systems as the PICNet can be generalized to solve inverse problems across various microscopies.
Fields of Study & Subjects
Advanced Electron Microscopy Techniques and Applications
Advanced X-ray Imaging Techniques
Integrated Circuits and Semiconductor Failure Analysis
Publication details
- Journal / source
- Advanced Photonics
- Publisher
- SPIE-Intl Soc Optical Eng
- Volume
- 8
- Issue
- 02
- Pages
- 1-4
- Publication date
- 3 April 2026