Boosting explainability of general visual inspection with a multihead vision-language model

View at publisher
Authors: Shiryu Ueno, Yoshikazu Hayashi, Shunsuke Nakatsuka, Hiroaki Aizawa, Kunihito Kato
Cited by: 0

Abstract

We present a multihead vision-language model for general visual inspection that jointly generates natural-language rationales for defects and their bounding-box localizations in a one-shot setting using a single in-context exemplar. Building on ViP-LLaVA, our architecture incorporates a box head trained with L1+(1−GIoU) loss and a count head trained with L1 loss while retaining the lm head for textual decision criteria. Evaluation on MVTec AD shows that the approach maintains high inspection F1 scores (0.950→0.932) but exhibits reduced pixel-level AUROC (0.730→0.646). To quantify localization traceability, we additionally report oracle best-box AUROC (and best IoU) computed from the predicted bounding boxes, indicating that at least one plausible localization is often produced even when the union-based pixel AUROC declines. We analyze common failure modes including formatting errors, coordinate drift, and count-box mismatches. Our training insights reveal when multihead learning enhances inspection traceability through explicit explanations and localizations, even when pixel-level performance metrics decline.

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Multimodal Machine Learning Applications Infrastructure Maintenance and Monitoring

Publication details

Journal / source
Journal of Electronic Imaging
Volume
35
Issue
03
Pages
1–10
Publication date
17 February 2026
Language
EN