Review of optically excited infrared thermal wave imaging for nondestructive testing: research status and development

Optically excited infrared thermal wave imaging offers the advantages of noncontact operation, rapid full-field acquisition, and high spatial resolution, enabling highly efficient detection of material defects. In recent years, driven by advances in high-power light sources, high-performance infrared detectors, and sophisticated data-processing algorithms, this technique has found widespread application in aerospace, electronics, and industrial manufacturing. This paper begins by outlining the fundamental detection principles of infrared thermal wave imaging. Then, a focused review was conducted on optical excitation pulses, phase-locking, and thermal wave radar imaging techniques based on the types of thermal waves. The current research status of each mode was analyzed, and the main challenges faced by optical excitation infrared thermal wave imaging were pointed out. Finally, it offers perspectives on future developmental trends for this technology.