Absolute thickness measurement of transparent glass using optical interferometer and deep learning

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Authors: Hwan Kim, Juncheol Bae, Jurim Jeon, Yangjin Kim
Cited by: 0

Fields of Study & Subjects

Optical measurement and interference techniques Advanced Measurement and Metrology Techniques Industrial Vision Systems and Defect Detection

Publication details

Pages
42–42
Publication date
16 January 2026