Reliability and failure analysis of high-speed 850nm multimode oxide-confined VCSELs lifetested in air and vacuum for space applications
Fields of Study & Subjects
Semiconductor Lasers and Optical Devices
solar cell performance optimization
Integrated Circuits and Semiconductor Failure Analysis
Publication details
- Journal / source
- Vertical-Cavity Surface-Emitting Lasers
- Pages
- 21–21
- Publication date
- 5 March 2026
- Language
- EN