Single-shot phase extraction using deep learning for noiseless dynamic surface metrology

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Authors: Juncheol Bae, Hwan Kim, Jurim Jeon, Heokjun Suh, Yangjin Kim
Cited by: 0

Fields of Study & Subjects

Optical measurement and interference techniques Surface Roughness and Optical Measurements Digital Holography and Microscopy

Publication details

Pages
77–77
Publication date
16 January 2026