Machine learning for quantum on-chip devices and measurements

Single photon emitters represent a critical component for enabling several quantum technologies such as quantum communication, quantum photonic computing, sensing, and imaging. One example of quantum imaging that leverages the non-classical nature of light radiated by quantum emitters is the so-called antibunching super-resolution microscopy. We present a machine learning (ML)-assisted approach for the realization of rapid antibunching super-resolution imaging and demonstrate 12 times speed-up compared to conventional, fitting-based autocorrelation measurements. The developed framework paves the way to the practical realization of scalable quantum on-chip devices hosting various types of quantum emitters as well as quantum material metrology. Additionally, for security applications, we develop a robust, ML-assisted on-chip device testing method that can be used to ensure the integrity of a chip avoiding risks of tampering and failure. Both ML approaches could pave the way to the realization of large-scale, secure quantum on-chip devices.