Remote-focusing-free single-objective oblique plane microscopy

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Authors: Wai Kin Hui, Man Teng Cheok, Kevin K. Tsia
Cited by: 0

Abstract

We present Aberration-assisted Scheimpflug Oblique Plane Microscopy (AS-OPM), a simpler and more cost-effective alternative to traditional Oblique Plane Microscopy (OPM). OPM allows fast, low-phototoxicity, and low-photobleaching 3D imaging using a single objective for both illumination and detection. However, its design depends on a complex two-objective remote focusing system, which increases cost, complexity, and alignment difficulty. AS-OPM overcomes these issues by replacing the remote focusing module with a single aspherical lens. It uses the Scheimpflug principle to partially correct the image tilt and extends the depth of focus by leveraging the lens aberrations simultaneously. The system achieves high spatial resolution, with lateral resolution ~1.0 μm and axial resolution ~1.77 μm. Overall, AS-OPM provides a simple yet effective solution for high-resolution, volumetric imaging in biological research.

Fields of Study & Subjects

Advanced Fluorescence Microscopy Techniques Digital Holography and Microscopy Advanced optical system design

Publication details

Journal / source
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing
Pages
29–29
Publication date
4 March 2026
Language
EN