Remote-focusing-free single-objective oblique plane microscopy
Abstract
We present Aberration-assisted Scheimpflug Oblique Plane Microscopy (AS-OPM), a simpler and more cost-effective alternative to traditional Oblique Plane Microscopy (OPM). OPM allows fast, low-phototoxicity, and low-photobleaching 3D imaging using a single objective for both illumination and detection. However, its design depends on a complex two-objective remote focusing system, which increases cost, complexity, and alignment difficulty. AS-OPM overcomes these issues by replacing the remote focusing module with a single aspherical lens. It uses the Scheimpflug principle to partially correct the image tilt and extends the depth of focus by leveraging the lens aberrations simultaneously. The system achieves high spatial resolution, with lateral resolution ~1.0 μm and axial resolution ~1.77 μm. Overall, AS-OPM provides a simple yet effective solution for high-resolution, volumetric imaging in biological research.
Fields of Study & Subjects
Advanced Fluorescence Microscopy Techniques
Digital Holography and Microscopy
Advanced optical system design
Publication details
- Journal / source
- Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing
- Pages
- 29–29
- Publication date
- 4 March 2026
- Language
- EN