Detection of removable contaminants on the surface of a glass substrate by using a bright-field multispectral imaging system (BMIS)

2026

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Authors: Yeeun Kim, Hyukjin Yang, Hyeongyu Choi, Hanjin Cho, Taeeun Kim, Hayeon Lee, Yoonchan Jeong

DOI: 10.1117/12.3080322

Cited by: 0

References: 6

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Spectroscopy and Chemometric Analyses Surface Roughness and Optical Measurements

References 6