High-power and ultrashort IR-driver platform for industrial coherent XUV metrology
Abstract
We report on the development of a robust 100W and 35fs IR platform to efficiently generate coherent XUV radiations down to 140eV. The secondary photon flux is used to performed ptychographic imaging of nanometric structures on semiconductor-wafers.
Fields of Study & Subjects
Advanced X-ray Imaging Techniques
Laser-Matter Interactions and Applications
Particle Accelerators and Free-Electron Lasers
Publication details
- Journal / source
- Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications
- Pages
- 19–19
- Publication date
- 4 March 2026
- Language
- EN