Full-field optical coherence microscopy with wavelength-segmented phase imaging for extended depth measurement

2026

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Authors: Minju Jeong, Jaeheung Kim, Chang‐Seok Kim, Hwidon Lee

DOI: 10.1117/12.3080711

Cited by: 0

Fields of Study & Subjects

Optical Coherence Tomography Applications Digital Holography and Microscopy Optical measurement and interference techniques