Extreme-throughput multimodal optical-sectioning structured illumination microscopy for large-area imaging

We present a high-speed, multimodal optical-sectioning structured illumination microscopy (OS-SIM) system for large-area surface microscopy. The system supports both reflectance and multiband fluorescence imaging with area-throughput up to ~190 cm²/min at 1.1 μm resolution. A low magnification objective and time-delay-integration (TDI) strip scanning sensor enable continuous imaging over a 16 mm-wide field-of-view. Inclusive of full sample automation and real-time image processing and display, the system achieves a space-bandwidth-time product of ~667 megapixels/sec for surface area imaging.