Toward low defect InP QCLs on silicon: process optimization via reduced strain, reduced number of stages and SEM-CL diagnosis

Novel In-Plane Semiconductor Lasers 2026

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Authors: Enrique Cristobal, Matthew Fetters, Amy W. K. Liu, Joel M. Fastenau, Ahmad Azim, Luke Milbocker, Alejandro M. Villalobos Meza, J. P. Erspamer, Arkadiy A. Lyakh
DOI: 10.1117/12.3080847
Cited by: 0

Fields of Study & Subjects

Semiconductor Lasers and Optical Devices Advanced Semiconductor Detectors and Materials Spectroscopy and Laser Applications

Publication details

Journal / source
Novel In-Plane Semiconductor Lasers
Pages
40–40
Publication date
5 March 2026
Language
EN