Continuous image scanning microscopy for instantaneous resolution enhancement

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Authors: Shih-Chi Chen, Huan Li
Cited by: 0

Abstract

We will present an image scanning microscopy (ISM) based on synchronized scanning of a polygon mirror (PM) and a linear stage with time-delay integration (TDI) to achieve instant resolution enhancement in one continuous acquisition. During imaging, the focused excitation point is scanned by the high-speed PM, forming a digital excitation line, and the subsequent emissions are de-scanned and re-scanned by the same PM within an intermediate optical expander. Meanwhile, a continuous scanning stage moves perpendicularly to the excitation line, with an equivalently expanded step, in synchronization with the camera acquisition in the line-scanning mode (i.e., 6-line sub-array mode). The scanned frames are reconstructed in real-time via TDI approaches, forming a resolution-enhanced image by a factor of >1.4 via the expansion of each scan.

Fields of Study & Subjects

Advanced Fluorescence Microscopy Techniques Advanced Image Processing Techniques CCD and CMOS Imaging Sensors

Publication details

Journal / source
Neural Imaging and Sensing
Pages
1–1
Publication date
5 March 2026
Language
EN