Detection of pits in cherries using shortwave-infrared (SWIR) hyperspectral imaging

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Authors: Naseeb Singh, Yuzhen Lu
Cited by: 0
References: 26

Fields of Study & Subjects

Spectroscopy and Chemometric Analyses Industrial Vision Systems and Defect Detection Smart Agriculture and AI

Publication details

Journal / source
Photonic Technologies in Plant and Agricultural Science
Pages
10–10
Publication date
5 March 2026
Language
EN