Compact Fourier ptychographic microscopy

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Authors: Piotr Zdańkowski, Maksymilian Chlipała, Mikołaj Rogalski, Maciej Trusiak
Cited by: 0

Fields of Study & Subjects

Advanced X-ray Imaging Techniques Digital Holography and Microscopy Optical measurement and interference techniques

Publication details

Journal / source
Quantitative Phase Imaging
Pages
8–8
Publication date
5 March 2026
Language
EN