Micro-nanoscale metrology for reference material size from speckle pattern images

Ultra-High-Definition Imaging Systems 2026

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Authors: Pakkhanan Sirikarntayuprakit, Suwan Plaipichit, Benjarat Ngansalung, Prathan Buranasiri
DOI: 10.1117/12.3088029
Cited by: 0
References: 14

Fields of Study & Subjects

Optical measurement and interference techniques Advanced Measurement and Metrology Techniques Surface Roughness and Optical Measurements

Publication details

Journal / source
Ultra-High-Definition Imaging Systems
Pages
26–26
Publication date
5 March 2026
Language
EN