In-operando sub-picosecond x-ray platform for material analysis with atomic scale resolution

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Authors: Raphaël G. C. R. Clady, Krishna Prasad Khakurel, A. Ferré, O. Peyrusse, Marc L. Sentis, Olivier P. Uteza
Cited by: 0

Fields of Study & Subjects

Advanced X-ray Imaging Techniques X-ray Spectroscopy and Fluorescence Analysis X-ray Diffraction in Crystallography

Publication details

Journal / source
Nanoscale and Quantum Materials: From Synthesis and Laser Processing to Applications
Pages
26–26
Publication date
4 March 2026
Language
EN