Laser scanner metrological traceability system

This paper investigates the issue of metrological traceability for laser scanners, aiming to establish a comprehensive and reliable traceability system. By developing a calibration model for surface contour scanning measurement errors based on a three-dimensional model, the paper achieves precise quantification and correction of measurement deviations in complex contour measurements. Additionally, a series of standard transfer artifacts, including standard spherical artifacts, standard ball plates, multi-faceted flat plates, and multi-feature curved surface artifacts, have been developed to provide standardised carriers for laser scanner metrological traceability. In experiments, the parameters of each artifact are measured using a 3D coordinate measuring machine (CMM) and used as reference true values. By comparing these with the measurement results from the laser scanner, the effectiveness of the established traceability system can be verified. This system uses a 3D coordinate measuring machine as the metrological standard instrument, ultimately traceable to the 633nm wavelength secondary standard, ensuring the accuracy and consistency of contour metrological traceability for laser scanners. This provides a crucial foundation for establishing a comprehensive traceability system for large-scale metrology.