MOVPE technology progress for GaO-based devices

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Authors: M. Heuken
Cited by: 0

Abstract

This talk presents a summary on recent progress in Metal-Organic Chemical Vapor Deposition (MOCVD) technology to satisfy industrial and academic demand in epitaxial growth technology as well as the direct impact on device performance. We discuss notable advancements in MOCVD, including improved film quality, growth uniformity, impurity control, dislocation reduction, automation, and simulation. Key factors driving progress include novel advanced reactor designs, automated wafer handling, cleaning procedures to minimize particle density on wafer and optimized process parameters on even larger wafer as well as continuous stable operation of the system. As examples for new market opportunities wide band gap (GaO, GaN, SiC) power devices and the related technology aspects will be compared and discussed.

Fields of Study & Subjects

Ga2O3 and related materials GaN-based semiconductor devices and materials Semiconductor materials and devices

Publication details

Journal / source
Oxide-based Materials and Devices
Pages
15–15
Publication date
5 March 2026
Language
EN