EMCAM-YOLOv8: enhancing screen defect detection with multi-channel attention
Fields of Study & Subjects
Industrial Vision Systems and Defect Detection
Advanced Neural Network Applications
Infrastructure Maintenance and Monitoring
Publication details
- Journal / source
- International Conference on Graphics and Image Processing (ICGIP)
- Pages
- 34–34
- Publication date
- 4 March 2026
- Language
- EN