EMCAM-YOLOv8: enhancing screen defect detection with multi-channel attention

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Authors: Jiaxue Wang
Cited by: 0
References: 4

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications Infrastructure Maintenance and Monitoring

Publication details

Journal / source
International Conference on Graphics and Image Processing (ICGIP)
Pages
34–34
Publication date
4 March 2026
Language
EN