Emulating self-attention with convolution embedded high-resolution shallow layer for detection of tiny bearing defects
Fields of Study & Subjects
Machine Fault Diagnosis Techniques
Industrial Vision Systems and Defect Detection
Advanced Neural Network Applications
Publication details
- Journal / source
- International Conference on Graphics and Image Processing (ICGIP)
- Pages
- 52–52
- Publication date
- 4 March 2026
- Language
- EN