Emulating self-attention with convolution embedded high-resolution shallow layer for detection of tiny bearing defects

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Authors: Xiaomin Zhao, Siow Hoo Leong, Beng Yong Lee, Sofianita Mutalib, Meng Lyu, Zhijun Zuo
Cited by: 0
References: 12

Fields of Study & Subjects

Machine Fault Diagnosis Techniques Industrial Vision Systems and Defect Detection Advanced Neural Network Applications

Publication details

Journal / source
International Conference on Graphics and Image Processing (ICGIP)
Pages
52–52
Publication date
4 March 2026
Language
EN