Research progress of scanning tunneling microscopy under extreme conditions

International Conference on Testing Technology and Automation Engineering (TTAE) 2026

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Authors: Chenwei Ye
DOI: 10.1117/12.3102055
Cited by: 0
References: 8

Fields of Study & Subjects

Surface and Thin Film Phenomena Force Microscopy Techniques and Applications Surface Chemistry and Catalysis

Publication details

Journal / source
International Conference on Testing Technology and Automation Engineering (TTAE)
Pages
93–93
Publication date
6 March 2026
Language
EN