Improved SVDD-based anomaly detection models

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Authors: Jiatong Liu, Bo Du, Junlong Feng, Ming Fang
Cited by: 0

Abstract

In this study, an SVDD (Support Vector Data Description) network is employed for unsupervised learning on industrial products. The feature extraction network is improved by incorporating frequency-domain information analysis and differential convolution to enhance image quality, thereby boosting the model's feature extraction accuracy. Meanwhile, a contrastive network is introduced to enable efficient utilization of images, addressing the challenge of few-shot learning. Ultimately, the proposed model achieves an accuracy of 87.6% on the industrial MVTec dataset when trained with only 100 normal samples.

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Anomaly Detection Techniques and Applications Advanced Neural Network Applications

Publication details

Journal / source
International Symposium on Robotics and Artificial Intelligence (ISRAI)
Pages
47–47
Publication date
12 February 2026
Language
EN