Large Language Models for Fault Localization: An Empirical Study
Abstract
Large Language Models (LLMs) have demonstrated strong performance on code-related tasks, particularly in automated program repair. However, repair effectiveness often depends on accurate upstream fault localization, while the statement-level fault localization capability of LLMs remains insufficiently evaluated. This paper presents a systematic empirical study of LLMs for statement-level fault localization. We evaluate four representative LLMs, including two open-weight models, Qwen2.5-Coder-32B-Instruct and DeepSeek-V3 and two closed-source models, GPT-4.1 mini and Gemini-2.5-Flash, on HumanEval-Java and Defects4J. The evaluation covers different input contexts and prompt strategies, including Zero-shot, Few-shot and Chain-of-Thought prompting. We further assess model performance from three complementary perspectives: Exact Match, Partial Match and output consistency and compare LLMs with representative non-LLM baselines, including PMD and LineDef, under the same source-code-only input setting. In addition, we analyze practical efficiency and cost in terms of end-to-end response time and token-based API cost. The results show that bug report context improves observed fault localization performance on Defects4J. Few-shot prompting improves performance in some cases but does not yield consistent gains and Chain-of-Thought prompting shows mixed effects across models. Overall, this study reveals the strengths, limitations, and practical trade-offs of LLMs in statement-level fault localization, providing empirical evidence for model selection and application in software engineering practice.
Fields of Study & Subjects
Software Engineering Research
Software Testing and Debugging Techniques
Software System Performance and Reliability
Publication details
- Journal / source
- International Journal of Software Engineering and Knowledge Engineering
- Publisher
- World Scientific Pub Co Pte Ltd
- Pages
- 1–33
- Publication date
- 27 June 2026
- Language
- EN