A NOVEL HYBRID DEPOSITION APPROACH FOR SILVER SELENIDE THIN FILMS: A VIEW ON STRUCTURAL, MORPHOLOGICAL, OPTICAL, THICKNESS, AND LUMINESCENCE CHARACTERIZATION
Abstract
A novel approach that comprises the coprecipitation method, a chemical method, and thermal evaporation method under high vacuum, a physical method, was designed to synthesize silver selenide thin films and coat them on two different substrates, viz, glass and Fluorine-doped Tin Oxide (FTO). The characterizations were performed on the powder and the thin film Ag 2 Se samples. X-Ray Diffractomete (XRD) analysis showed the enhanced structural properties in Ag 2 Se-coated FTO samples from the structural metrics and the well-defined, sharp peaks in its diffraction profile. The morphological analysis showed rod-shaped Ag 2 Se particles and the changes in morphology in thin films. UV–Vis spectroscopy analysis showed the variation in band gap, extinction coefficient, and refractive index of the samples. Luminescence properties of the samples showed an intense peak in the visible region around 500[Formula: see text]nm. The elemental composition was confirmed from Energy Dispersive X-ray Spectroscopy (EDX) data. The thickness of the samples was found to be 319[Formula: see text]nm.
Fields of Study & Subjects
Chalcogenide Semiconductor Thin Films
Phase-change materials and chalcogenides
Advanced Materials and Semiconductor Technologies
Publication details
- Journal / source
- Surface Review and Letters
- Publication date
- 29 January 2026
- Language
- EN