Annealed proton-exchange waveguides in mixed lithium niobate-tantalate solid solutions: Defect structure and optical losses

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Authors: Aleksei V. Sosunov, Andrey R. Kornilicyn, A.S. Pankov, R.S. Ponomarev, Dmitrii N. Moskalev, E.D. Voblikov, Anatolii A. Mololkin, Rashid R. Fakhrtdinov, Evgeniy Savelyev, Andrey R. Akhmatkhanov, V Y Shur, Mariana K. Kuneva
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References: 35

Abstract

New optical materials are one of the drivers of the development of integrated and nonlinear photonics. In this paper, we study the prospects for using mixed crystals of X and Z-cut lithium niobate-tantalate (LNT) solid solution for the manufacturing of optical waveguides by the annealed proton exchange (APE) method. We have evaluated the defectiveness of the LNT samples by means of scanning electron microscopy visualization and optical profilometry after wet chemical etching and by X-ray diffraction analysis. The studies showed that the LNT structure has pores with a depth up to 60[Formula: see text]nm and surface density of 2 pcs/mm[Formula: see text]. Also, it was established that LNT crystals possess a higher density of etch pits or dislocations regardless of the crystallographic orientation as compared to conventional lithium niobate. We determined the geometric parameters of single-mode channel APE waveguides by OptiBPM simulation. We experimentally measured the optical losses of channel APE waveguides by the fiber-to-fiber method. The optical losses were 6.2[Formula: see text]dB (Z-cut) and 19.0[Formula: see text]dB (X-cut), which is two times higher than those for APE LN under the same conditions. This effect was related to surface and bulk defects of LNT crystals. The study highlights the relationship between structural and optical characteristics of APE LNT waveguides and contributes to the further study and development of mixed LNT crystals as a material platform for photonics and optics.

Fields of Study & Subjects

Photorefractive and Nonlinear Optics Photonic and Optical Devices Nonlinear Photonic Systems

Publication details

Journal / source
Journal of Advanced Dielectrics
Volume
16
Issue
04
Publication date
6 March 2026
Language
EN