Single- and Two-Stage BJT Amplifiers

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Authors: Wilfredo Rivas-Torres, Zvi S Roth
Cited by: 0

Abstract

While covering the design of CE amplifiers, with and without degeneration resistors, and the design of emitter follower buffers, the chapter introduces ADS users to yield analysis and sensitivity analysis. These are important tools in assessing the effects of components’ tolerances on the success of designs. In yield analysis, ADS performs a large number of runs with random parameters, and the success of the design is assessed statistically. Sensitivity analysis is an important step on the road to yield enhancement. This chapter discusses in detail how ADS represents different types of signals and how such insights, such as dimensionality reduction of signals, lead to successful computation of signals’ statistical features and construction of data analysis histogram plots.

Fields of Study & Subjects

Analog and Mixed-Signal Circuit Design Radio Frequency Integrated Circuit Design Low-power high-performance VLSI design

Publication details

Journal / source
CRC Press eBooks
Pages
294–347
Publication date
3 February 2026
Language
EN
Document type
Book chapter