Single- and Two-Stage BJT Amplifiers
Abstract
While covering the design of CE amplifiers, with and without degeneration resistors, and the design of emitter follower buffers, the chapter introduces ADS users to yield analysis and sensitivity analysis. These are important tools in assessing the effects of components’ tolerances on the success of designs. In yield analysis, ADS performs a large number of runs with random parameters, and the success of the design is assessed statistically. Sensitivity analysis is an important step on the road to yield enhancement. This chapter discusses in detail how ADS represents different types of signals and how such insights, such as dimensionality reduction of signals, lead to successful computation of signals’ statistical features and construction of data analysis histogram plots.
Fields of Study & Subjects
Analog and Mixed-Signal Circuit Design
Radio Frequency Integrated Circuit Design
Low-power high-performance VLSI design
Publication details
- Journal / source
- CRC Press eBooks
- Pages
- 294–347
- Publication date
- 3 February 2026
- Language
- EN
- Document type
- Book chapter