Characterization techniques for PV materials

Photovoltaic (PV) materials and devices are one of the key instruments for sustainable development as they produce green energy. For PV applications, there are certain qualities that a material needs to possess, and analysis of these properties is crucial for the applicational. This book chapter includes different characterization methods such as X-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM), which give structure and morphology-related information. The electrical properties of the material are normally analyzed using the Hall measurements, and the ultraviolet–visible (UV–Vis) spectroscopy and photoluminescence (PL) methods are discussed in detail for the determination of the most important parameters such as absorbance, transmittance, reflectance, bandgap, and defect states of the semiconductor material. Energy dispersive X-ray photon spectroscopy (EDS) gives chemical properties of the material. Raman analysis is used for information on phase transitions. The X-ray photoelectron spectroscopy (XPS), cyclic voltammetry (CV), electrochemical impedance spectroscopy (EIS), and ultraviolet photoelectron spectroscopy (UPS) analyses are carried out to analyze the chemical, electrical, and electronic properties of the specimen. Apart from these properties, the optoelectronic analysis also plays a key role in determining the electrical response to the incident electromagnetic wave, which normally depends on the bandgap energy, absorption coefficient, type, carrier concentration, and mobility of the materials. This book chapter analyzes these characterizations along with examples for further understanding.