Boron Doped Diamond Films

View at publisher
Authors: R. H. Zalavutdinov, V. H. Alimov, A. E. Alexenko, A.E. Gorodetsky, A. P. Zakharov
Cited by: 0

Abstract

Boron doped diamond films obtained by a CVD method on single-crystal Si and A1N ceramics have been investigated by means of Electron Probe Microanalysis (EPMA), Secondary Ion Mass Spectrometry (SIMS), X-Ray Diffraction (XRD), Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM). SIMS analyses of the films grown at different conditions have shown a B/C atomic ratio range from 4.3 × 10 -4 to 3.5 × 10 -3 . The films are comprised of octahedra (2-5 μ m) with a block structure of 0.1-0.3 μ m in size. Resistance of the films varied in the range 10 3 to 10 6 Ohm. Luminescence under electron beam excitation is light-green, which differs from that of undoped diamond films which luminesce in the blue.

Fields of Study & Subjects

Diamond and Carbon-based Materials Research Boron and Carbon Nanomaterials Research Metal and Thin Film Mechanics

Publication details

Journal / source
CRC Press eBooks
Pages
121–125
Publication date
2 February 2026
Language
EN
Document type
Book chapter