Diamond-Like Film-Porous Silicon Systems: New Approach for Optoelectronic Devices Fabrication

A detailed experimental analysis is presented based on photoluminescence (PL) spectra from series of coated and uncoated porous silicon (PS) samples by diamond-like carbon (DLC) films using the time-resolved photoluminescence spectroscopy. The PL spectra from uncoated PS samples has shown two main luminescence bands whose maximum intensities are located: around 450 nm with life time about some ns, and around 630 nm with life time about 20 μ s. The PL spectra from coated PS samples has shown the shift of the band ∼630 nm to the lower wavelength side (about 610 nm). The band ∼450 nm drastically decreased and two new bands around 510 and 590 nm have arisen in this case. The DLC film-porous silicon systems survived durability tests. Environmental tests also revealed the protection imparted by DLC films to porous silicon devices. Thus, PS + DLC systems appear to be a promising avenue for further investigation and may form the basis for the manufacture of new electronics and optoelectronics devices.