Study on the Thermal Expansion Behaviour of Single Crystal Tellurium Dioxide by PRD, TG-DTA and XRD

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Authors: C.-W. Lu, T.-G. Xi, Y-X. Chen
Cited by: 0

Abstract

The thermal expansion behavior of Te0 2 single crystal is studied by PRD ( Push-Rod Dilatometer ), TG-DTA ( Thermogravimetry-Differential Thermal Analysis ) and XRD ( X-Ray Diffraction ) in this work. The thermal expansion coefficient of the Te0 2 single crystal along a and c axes in the temperature region of 370-500°C is measured by push rod dilatometer method for the first time. The melting point of the Te0 2 is measured by TG-DTA method and the relationship between the thermal expansion coefficient and the melting point is discussed. Furthermore, the anisotropy of the thermal expansion of the Te0 2 single crystal is studied according to the structure and the characteristic of cleavage as well as the comparison of the chemical bonding strength of a axis and c axis.

Fields of Study & Subjects

Thermal Expansion and Ionic Conductivity Crystal Structures and Properties X-ray Diffraction in Crystallography

Publication details

Journal / source
CRC Press eBooks
Pages
66–73
Publication date
2 February 2026
Language
EN
Document type
Book chapter