Study on the Thermal Expansion Behaviour of Single Crystal Tellurium Dioxide by PRD, TG-DTA and XRD
Abstract
The thermal expansion behavior of Te0 2 single crystal is studied by PRD ( Push-Rod Dilatometer ), TG-DTA ( Thermogravimetry-Differential Thermal Analysis ) and XRD ( X-Ray Diffraction ) in this work. The thermal expansion coefficient of the Te0 2 single crystal along a and c axes in the temperature region of 370-500°C is measured by push rod dilatometer method for the first time. The melting point of the Te0 2 is measured by TG-DTA method and the relationship between the thermal expansion coefficient and the melting point is discussed. Furthermore, the anisotropy of the thermal expansion of the Te0 2 single crystal is studied according to the structure and the characteristic of cleavage as well as the comparison of the chemical bonding strength of a axis and c axis.
Fields of Study & Subjects
Thermal Expansion and Ionic Conductivity
Crystal Structures and Properties
X-ray Diffraction in Crystallography
Publication details
- Journal / source
- CRC Press eBooks
- Pages
- 66–73
- Publication date
- 2 February 2026
- Language
- EN
- Document type
- Book chapter