Laser Flash Diffusivity Measurements of Filled Adhesive Effective Thermal Conductivity and Contact Resistance Using Multilayer Methods

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Authors: R. C. Campbell, S. E. Smith, R. L. Di Etz
Cited by: 0

Abstract

Thermal modeling of electronics packages requires accurate thermophysical property data for package materials. The ability to accurately predict the device junction temperature has become critical due to the increasing power and speed and decreasing size of semiconductor devices. Accurate data for the thermal resistance of the adhesive bondlines used in electronics packaging is critical because this thermal resistance can be a significant part of the total thermal resistance in the heat flow paths from the device junction to the package case or ambient.

Fields of Study & Subjects

Electronic Packaging and Soldering Technologies Thermal properties of materials Heat Transfer and Numerical Methods

Publication details

Journal / source
CRC Press eBooks
Pages
191–202
Publication date
2 February 2026
Language
EN
Document type
Book chapter