Missing Cell Defect Analysis of Reversible 1-Bit Magnitude Comparator

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Authors: Vaishali H. Dhare, Divy Modi
Cited by: 0

Abstract

Complementary metal oxide semiconductor (CMOS) technology has established the fabrication of processors with less area and power dissipation with high-speed performance. However, this technology causes heat and energy dissipation that can cause hurdles in the processor’s speed. Irreversible computation in CMOS causes heat and energy dissipation. Solution to this heat and energy dissipation is to use reversible logic instead of the conventional irreversible logic synthesis. In this chapter, a reversible technology-based 1-bit comparator design is proposed. Quantum-dot cellular automata (QCA) nanotechnology is used for the implementation of proposed design. QCA designer tool is used for device-level implementation. The proposed reversible comparator is also implemented at the logic level using Verilog hardware description language (HDL) to compare the results with device-level implementation. The synthesis and simulation are carried out using the Xilinx ISE tool. Further, the missing cell defect analysis of the proposed circuit is carried out and presented in this chapter.

Fields of Study & Subjects

Quantum-Dot Cellular Automata Cellular Automata and Applications VLSI and Analog Circuit Testing

Publication details

Journal / source
Apple Academic Press eBooks
Pages
101–119
Publication date
11 February 2026
Language
EN
Document type
Book chapter