Highly curved large-format sensors for infrared imaging

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Authors: Mark R. O’Masta, Binh‐Minh Nguyen, Eric C. Clough, Alfredo Gonzalez, Alexander R. Gurga, Brian Hempe, Jacob M. Hundley, Greg Jacques, Kyle LaFevre, Christian Neuhaus, Scott Linton, Francisco Perez
+5 more Trevor Sasse, David Saxum, Tobias A. Schaedler, Amber Truong, Geoffrey P. McKnight
Cited by: 0
References: 18

Abstract

A curved, rather than flat, photoreceptive surface requires fewer optical elements and enhances illumination and sensitivity uniformity for wide-field vision. While such designs are common in vertebrate eyes, creating manmade curved sensing surfaces using high-performance sensors has been technologically challenging. Here, we surpassed previous practices by manipulating the strain within a die using a ductile metal layer. This enabled scalability to large-format sensors, which are valuable for capturing wide viewing angles with high resolution. We showcased this methodology using two types of III-V compound semiconductor photodetectors for mid-wave infrared (MWIR) imaging. The radiometric response of a hybridized fanout chip curved to a solid angle of 0.24 sr - over 300% beyond the limit of standard methods - was evaluated. A fully imaging focal plane array curved to 0.11 sr exhibited >97% operability. This demonstration of a spherically curved, cryogenically cooled MWIR imaging sensor highlights the feasibility of curving sensors comprised of heterogeneous semiconductor layering, which are commonly used in infrared, visible, and ultraviolet imagers.

Fields of Study & Subjects

Advanced Semiconductor Detectors and Materials CCD and CMOS Imaging Sensors Infrared Target Detection Methodologies

Publication details

Journal / source
Optics Express
Volume
34
Issue
4
Pages
6880–6880
Publication date
9 February 2026
Language
EN