Relayed-loop optical scan amplification

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Authors: Christopher Warkentin, Harishankar Jayakumar, Deano M. Farinella, Zachary Newman, Samuel Stanek, Runze Liu, Alishan Amirali, Aaron Kerlin
Cited by: 1
References: 20

Abstract

Laser scanning underpins many modern sensing, processing, and fabrication technologies. Typically, the speed of a deflector is constrained by its optical invariant and, therefore, the number of resolvable spots it can address. Some passive optical systems have been developed that can double the optical invariant of a single deflector. We propose a method to push this limit beyond 2× by relaying the deflected beam onto the deflector within an optical loop. We apply this relayed-loop optically amplified deflection (ReLOAD) method to achieve 8× amplification of electro-optical (EO) deflection, a technology with unparalleled speed, but limited optical invariant. With EO-ReLOAD, we demonstrate two-photon imaging at a 10 kHz frame rate, 1 MHz line scan rate, and µs step times across an addressable space well beyond the capabilities of typical EO deflectors. This technology overcomes the speed versus resolution trade-off, enabling a new class of deflectors for probing phenomena on microsecond timescales.

Fields of Study & Subjects

Near-Field Optical Microscopy Integrated Circuits and Semiconductor Failure Analysis Optical Network Technologies

Publication details

Journal / source
Optica
Publisher
Optica Publishing Group
Volume
13
Issue
5
Pages
940–940
Publication date
23 April 2026
Language
EN