Transfer-function approach to substrate-enhanced diffraction tomography
Abstract
Forward and backward scattering provide complementary volumetric and interfacial information, yet conventional three-dimensional (3D) imaging typically accesses only one. We present a substrate-enhanced diffraction tomography approach that simultaneously recovers both channels under multi-angle epi-illumination. This geometry captures one forward- and two backward-scattering bands in axially symmetric Fourier regions, where their complementary coverage enables phase–absorption separation in a non-Hermitian spectrum. Explicit 3D transfer functions are derived for both channels, and an axial Kramers–Kronig relation is established to incorporate substrate-induced boundary conditions in a unified framework. Our results establish a label-free, high-resolution 3D imaging modality that surpasses the limits of existing methods.
Fields of Study & Subjects
Advanced X-ray Imaging Techniques
Microwave Imaging and Scattering Analysis
Digital Holography and Microscopy
Publication details
- Journal / source
- Optica
- Publisher
- Optica Publishing Group
- Volume
- 13
- Issue
- 4
- Pages
- 661–661
- Publication date
- 23 February 2026
- Language
- EN