Diamond-Scanning Nitrogen-Vacancy Center Probe Microscope
Abstract
The principle of the diamond-scanning nitrogen-vacancy (NV) center probe microscope is introduced, along with our method for fabricating an NV center-containing pillar probe using laser cutting and focused ion beam milling. The NV center probe attached to the apex of a tuning-fork-based atomic force microscope (AFM) enables simultaneous imaging of an AFM topography and an optically detected magnetic resonance signal. Stray magnetic-field detection from magnetic samples and their structures imaging is demonstrated.
Fields of Study & Subjects
Diamond and Carbon-based Materials Research
Force Microscopy Techniques and Applications
Advanced Fluorescence Microscopy Techniques
Publication details
- Journal / source
- Vacuum and Surface Science
- Volume
- 69
- Issue
- 2
- Pages
- 75–79
- Publication date
- 9 February 2026
- Language
- EN