A modified-two-fold-deep-learning-classifier paradigm for crop disease detection

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Authors: M. Chithambarathanu, M. K. Jeyakumar
Cited by: 0

Fields of Study & Subjects

Smart Agriculture and AI Advanced Neural Network Applications Industrial Vision Systems and Defect Detection

Publication details

Journal / source
International Journal of Computational Vision and Robotics
Volume
16
Issue
2
Pages
191–221
Publication date
1 January 2026
Language
EN