8 Electron Tomography Methods for Visualizing Charged Interfaces

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Authors: Juhyeok Lee, M. B. C. Scott, Michael Whittaker
Cited by: 0
References: 91

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Electron and X-Ray Spectroscopy Techniques Advanced Materials Characterization Techniques

Publication details

Journal / source
De Gruyter eBooks
Volume
91B
Issue
1
Pages
219–235
Publication date
31 January 2026
Language
EN
Document type
Book chapter