X-Area: enabling transparent control in single-crystal measurement and data processing
Abstract
Abstract X-Area is the uniquely versatile software suite connected to STOE single crystal diffractometers. Its abilities range from maintaining and steering the diffractometer itself to the reduction of measured data. In the following we will give a general overview of X-Area’s features and provide insight into specific software parts. For indexing and integration, X-Area offers in each case one program supporting more detailed configuration options and one application emphasizing automation. Furthermore, we will discuss the scaling and diagnosis tools available, which provide deeper insight into the collected X-ray data, therefore allowing for a better informed choice of data treatment. Everything is rounded off with an example of measurement results with a standard nickel salen crystal.
Fields of Study & Subjects
X-ray Diffraction in Crystallography
Crystallography and Radiation Phenomena
Advanced X-ray Imaging Techniques
Publication details
- Journal / source
- Zeitschrift für Kristallographie - Crystalline Materials
- Publisher
- Walter de Gruyter GmbH
- Volume
- 241
- Issue
- 3-4
- Pages
- 41–51
- Publication date
- 3 March 2026
- Language
- EN