X-ray Diffraction contrast tomography raw data in pre-deformed Ti-7Al sample

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Authors: Henry Proudhon, Patrick G. Callahan, Jean‐Charles Stinville, Wolfgang Ludwig
Cited by: 0

Abstract

A Ti-7Al small tension sample, deformed slightly above the elastic limit was characterized by Diffraction Contrast Tomography to further study the individual grain plastic activity using X-ray topotomography. The sample cross section is 600 microns and the acquisition consists of two partially overlapping DCT scans, each composed of 3600 equally spaced projections over 360 degrees integrated over 0.05 degrees resulting in 7200 frames for each scan.

Fields of Study & Subjects

Advanced X-ray Imaging Techniques X-ray Diffraction in Crystallography Advanced Materials Characterization Techniques

Publication details

Journal / source
European Synchrotron Radiation Facility
Publication date
1 January 2026
Language
EN
Document type
Dataset